HOME | LOGIN | MEMBER JOIN | CONTACT US | ENGLISH

Food Science and Biotechnology
→ Food Science and Biotechnology 2019 ; 28(3): 731-739
Change in dielectric properties of sweet potato during microwave drying
Dongyoung Lee1, Changyeun Mo2, Chang Joo Lee3, Seung Hyun Lee1
1Department of Biosystems Machinery Engineering, College of Agricultural and Life Science, Chungnam National University, 99 Daehak-ro, Yuseong-gu, Daejeon 34134, Republic of Korea, 2National Institute of Agricultural Sciences, Rural Development Administration, 310 Nonsaengmyeong-ro, Wansan-gu, Jeonju-si, Jeollabuk-do 54875, Republic of Korea, 3Department of Food Science and Biotechnology, College of Life Resource Science, Wonkwang University, 460 Iksandaero, Iksan, Jeonbuk 54538, Republic of Korea
ABSTRACT
Sweet potato slices and strips (thickness of 6 and 9 mm, respectively) as single layer were dried at different microwave power levels (90 W to 900 W) in order to determine the effect of microwave power and sample shape on drying characteristics. Dielectric properties of sweet potato slices were measured during microwave drying. Drying time for both samples was decreased with increase in microwave power, and drying time of strips was longer than slices in the microwave power range between 90 and 720 W. Page model was suitable for describing experimental drying data regardless of microwave power and shape of sweet potato samples. Dielectric properties of sweet potato slices were decreased with a decrease in moisture content. The change in dielectric properties of sweet potato slices could be predicted by Henderson and Pabis model and could be applied to estimate the change in moisture content of sweet potato during microwave drying.
KEYWORD
Sweet potato, Microwave drying, Drying models, Dielectric properties
Food Science and Biotechnology 2019 ; 28(3): 731-739
List